Features of titanium oxide memristor fabrication by pulsed laser deposition

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Abstract

The structural and electrophysical properties of titanium oxide based memristor obtained by pulsed laser deposition were analysed. The experimental results found the possibility of fine tuning of memristor active layers stoichiometry during deposition. In addition, the atomic force microscopy analysis of the surface of titanium oxide films revealed its high morphological homogeneity and continuity. The obtained memristors with gold contacts have been possessed bipolar switching mechanism and high endurance. (© 2015 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)

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